- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 31/303 - Contactless testing of integrated circuits
Patent holdings for IPC class G01R 31/303
Total number of patents in this class: 83
10-year publication summary
|
5
|
9
|
11
|
5
|
8
|
10
|
3
|
4
|
3
|
1
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Techinsights Inc. | 92 |
13 |
| STMicroelectronics (Crolles 2) SAS | 634 |
4 |
| Intel Corporation | 45621 |
3 |
| Renesas Electronics Corporation | 6305 |
3 |
| STMicroelectronics S.r.l. | 3693 |
3 |
| Texas Instruments Incorporated | 19376 |
2 |
| Texas Instruments Japan, Ltd. | 1656 |
2 |
| Applied Materials Israel, Ltd. | 549 |
2 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
2 |
| ASML Netherlands B.V. | 6816 |
2 |
| Synopsys, Inc. | 2829 |
2 |
| Hamamatsu Photonics K.K. | 4161 |
2 |
| inTEST Corporation | 32 |
2 |
| Semiconductor Insights Inc. | 2 |
2 |
| NXP B.V. | 2185 |
2 |
| Samsung Electronics Co., Ltd. | 131630 |
1 |
| Qualcomm Incorporated | 76576 |
1 |
| Hitachi, Ltd. | 16452 |
1 |
| Huawei Technologies Co., Ltd. | 100781 |
1 |
| Altera Corporation | 2241 |
1 |
| Other owners | 32 |